XRD Omega scanner
A technique for determining the crystallographic orientation (orientation) of Omega crystals
Method for characterizing relative to outer surface or other geometrical characteristics during growth and application of single crystal and oriented material. More and more researchers pay more attention to the crystal orientation test and the single crystal quality evaluation.
X - ray diffraction method is the main means of the crystal structure of the detection, but the conventional X ray diffraction method and instrument by the probe can receive normal crystal plane diffraction in crystal X-ray diffraction on the eye, so there is only one crystal face strong diffraction peak or a diffraction peak does not appear. In order to obtain a complete lattice orientation map, it is often necessary to add texture analysis attachment or three bit rotating table. This process is complex and difficult to operate.