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Boyue Instruments Invites You To Participate In 2015 China International Optoelectronic Expo
Browse the number: 120    Release date:2015-08-28

Boyue Instruments Invites You To Participate In 2015 China International Optoelectronic Expo

       August 31 - September 3,2015,Boyue Instruments  invites you to participate in 2015 China International Optoelectronic Expo, you are welcome to visit !Boyue Instruments booth, booth No.: 7E02, then, Boyue Instrumentsbooth will show the Mahr Aspheric Surface Measuring System , Bruker Dektak XT,,,Welcome to visit us!

          


 
Optical Emission Spectrometry-Spark Spectromrter Q2 ION/Q4 TASMAN/Q4 MOBILE/Q8 MEGELLAN
Handheld XRF Spectrometry-S1TITAN 
Micro XRF-M1 ORA/M1 MISTRAL/M4 TORNADO
S2 PICOFOX TXRF Spectrometer
CS/ONH-Analysis
3D Optical Microscopy-Contour GT/NPFlex
Atomic Force Microscopy-Innova/Dimension Edge/Dimension Icon
EDS/WDS/EBSD/Micro-XRF on SEM/Micro-CT for SEM
Stylus Profilometry-DEKTAK XT
NanoCalc Thin Film Reflectometry System
Particle Size Analyzer
EL Detection System
Metallographic microscope
Length measuring instrument/Cylindricity instrument/Roughness contourgraphGear measuring/Tool measuring instrument/Aspheric surface measuring system/Tool instrument/Shaft measurement system

Contact Us:021-37018108 info@boyuesh.com





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